Ion Beam Analysis



Principle

Ion Beam Analysis (IBA) is based on the interaction, at both the atomic and the nuclear level, between accelerated charged particles and the bombarded material. When a charged particle moving at high speed strikes a material, it interacts with the electrons and nuclei of the material atoms, slows down and possibly deviates from its initial trajectory. This can lead to the emission of particles or radiation whose energy is characteristic of the elements which constitute the sample material.

The spectrometric analysis of this secondary emission may lead to:


The IPNE has access to 3 accelerators from which particles of sufficient energy may be obtained:

The nature of the secondary emission detected determines the type of analysis which would produce the optimal results. The various methods are to a certain degree complementary.

The methods discussed present a certain number of common characteristics:

The sensitivity and reproducibility of these techniques are dependent on the nature of the target, its texture, its dielectric constant, and its thermic resistance in vacuum. It would therefore be futile to give specific numbers. Each type of analysis must be considered as a special case and treated as such.

These accelerated particle beams allow the setting of the four methods based on the specific processes that are described below.

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Ion Beam Analysis Methods

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Experimental Set-up

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Last Update: August 97
Henri-Pierre GARNIR <hpgarnir@ulg.ac.be>
David STRIVAY<dstrivay@ulg.ac.be>